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ecb010d441
All the ADIS devices perform, at the beginning, a self test to make sure the device is in a sane state. Previously, the logic was that the self-test was performed in adis_initial_startup() and if that failed a reset was done and then a self-test was attempted again. This change unifies the reset mechanism under the adis_initial_startup() call. A HW reset will be done if GPIO is configured, or a SW reset otherwise. This should make sure that the chip is in a sane state for self-test. Once the reset is done, the self-test operation will be performed. If anything goes wrong with self-test, the driver should just bail/error-out (i.e. no second attempt). The chip would likely not be a in a sane state state if the self-test fails after a reset. Signed-off-by: Nuno Sá <nuno.sa@analog.com> Signed-off-by: Alexandru Ardelean <alexandru.ardelean@analog.com> Signed-off-by: Jonathan Cameron <Jonathan.Cameron@huawei.com> |
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| .. | ||
| bmi160 | ||
| inv_mpu6050 | ||
| st_lsm6dsx | ||
| adis.c | ||
| adis16400.c | ||
| adis16460.c | ||
| adis16480.c | ||
| adis_buffer.c | ||
| adis_trigger.c | ||
| fxos8700.h | ||
| fxos8700_core.c | ||
| fxos8700_i2c.c | ||
| fxos8700_spi.c | ||
| Kconfig | ||
| kmx61.c | ||
| Makefile | ||